Cantilever Cantilever Probe Card_Cantilever Cantilever Probe Card

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Product list

YAMAHA Precision Testing Instr… READ precision testing instrum… Elastic needle disk testing in… Height difference testing inst… Adjustable needle testing inst… High precision needle testing … HDI large-sized testing instru… Vertical Probe Card - HW Type Special semi-automatic testing… Semi-automatic testing instrum… Cantilever Cantilever Probe Ca… Functional testing instruments… Automation equipment Heating microneedle testing in… OLED testing instruments IC carrier board testing instr…

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Cantilever Cantilever Probe Card

Equipment parameters

Advantages: Mature technology and low testing costs
Disadvantages: Long production lead time and short testing life
Scope of application: Pin count up to 2000, MCU, CIS, LCD Driver, Logic

telephone：

0512-67078916

Immediately consult

Product parameters

悬臂式探针卡 - Cantilever
制程能力	Max Pin count	Min Pad Pitch	Max. Layer
V-Probe	2500pins	28 um	12 Layer
友商	＜2000pins	40 um	8 Layer